Member Spotlight: IMAPS Devices Packaging Conference Celebrates 20 Years

This episode was recorded live at the IMAPS Device Packaging Conference – helping celebrate the event’s 20th year. The record turnout included many of our 3D InCites Community members. Françoise von Trapp spoke with several of them who were exhibiting and presenting, and in some cases, simply attending. 

 Alex Ospina of ACM Research discussed the latest technologies in wafer-level packaging, and the company’s focus on developing novel IP technologies to address industry challenges. You’ll hear about the company’s new vacuum cleaning tool designed to remove flux from bonds in smaller chiplets. You’ll also learn about the company’s approach to reducing its environmental impact.

Tim Olson, of Deca, shares big news about the company’s collaboration with ASU to create an open lab for innovation for innovation, licensing its M-Series and Adaptive Patterning technology, and working with ASU to outfit a fab with unique equipment.

Laura Mirkarimi and Oliver Zhao, of Adeia, explain the important role optical interferometry plays in atomic-level hybrid bonding. Zhao explains how they are using AI-powered neural networks to identify defects in the hybrid bonding process, with a focus on categorizing defects based on their relevance to certain process steps.

Manuela Junghähnel, of Fraunhofer IZM-ASSID,  explains her new role taking over the leadership of IZM-ASSID, from Jürgen Wolf.  She talks about learning the pilot scale to the production line created by Wolf. She also explains the relationship from the parent IZM and IZM ASSID.

Brian Riley, of QP Technologies, shares a history of advanced packaging technologies, and the company. He describes QPs' proprietary process for flip chip packages, the use of open mold plastic packages, and overmold QFNs.

Justin Locke, of Siemens EDA discusses innovations in functional verification of 3D Heterogeneous integration connectivity. He explains about the importance of formal verification in the design process, highlighting its ability to catch errors early on and prevent physical implementation issues.

Peter Cronin, of MRSI Mycronic talks about new technologies and interconnects in optical packaging, highlighting the need for active alignment tools. He introduces the Active Aligner.

Chapters

• 1:01 Alex Ospina, ACM Research
• 9:40 Tim Olson, DECA
• 16:40 Laura Mirkarimi and Oliver Zhao, Adeia
• 29:31 Manuela Junghähnel, Fraunhofer IZM-ASSID
• 37:18 Brian Riley, QP Technologies
• 44:22 Justin Locke, Siemens DSW
• 49:51 Peter Cronin, MRSI Systems